Collaboration with TNO

02 February 2016

SwissLitho started collaboration with TNO in Delft to evaluate if the NanoFrazor technology can be implemented in the wafer-level parallel AFM metrology system of TNO. This principle would increase the throughput of the NanoFrazor towards industrial applications. This principle would increase the throughput of the NanoFrazor towards industrial applications. You can get an impression of the system of TNO in this video.